Eddy Current Array Equipment is capable of reproducing the flaw detection techniques of most other eddy current methods. This method though had several distinct advantages such as:
• Being able to scan a larger area at one time while maintaining a high resolution,
• A lesser need for complex robotics to actually move the probe,
• Improved flaw detection due to the C-scan imaging, and
• Complex shapes can be inspected using this method because the probes can be customized to the profile of the part being inspected.